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UID:pretalx-38c3-P9WRAY@cfp.cccv.de
DTSTART;TZID=CET:20241227T230000
DTEND;TZID=CET:20241228T000000
DESCRIPTION:IRIS (Infra-Red\, *in situ*) is a technique for non-destructive
 ly inspecting the construction of a select but common type of chip. It can
  improve visibility into our hardware and provide supporting evidence of i
 ts correct construction\, without desoldering chips or expensive analytica
 l gear. This talk covers the theory behind IRIS\, as well as some embodime
 nts of the technique. I will also frame the relevance of IRIS in the face 
 of various threat scenarios. Time permitting\, I’ll also show how you ca
 n do it at home by peeking around a few chips as a demo.
DTSTAMP:20241227T121833Z
LOCATION:Saal GLITCH
SUMMARY:IRIS: Non-Destructive Inspection of Silicon - Andrew 'bunnie' Huang
URL:https://fahrplan.events.ccc.de/congress/2024/fahrplan/talk/P9WRAY/
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